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  • Breakdown and Leakage Current Measurements on High Voltage Semiconductor Devices

    This application note describes how to test new silicon carbide (SiC) and gallium nitride (GaN) high voltage, high power semiconductor devices, taking into consideration test system safety, wide voltage range, and accurate current measurement. Read More

    75 Watt, Single-Output Benchtop Power Supply

    This Circuit Note outlines a low cost, compact, and easily configured high-quality benchtop power supply solution for standalone operation or integration into other equipment. Read More

    Peak Current of Isolated Gate Drivers

    This article discusses the issues with using peak current as a deciding factor when selecting a gate driver for a specific application and compares some of the more common representations of peak current in data sheets. A comparison between gate drivers... Read More

    Designing for the Intelligent Edge

    The intelligent edge brings a wide variety of new opportunities and challenges for virtually every industry. Embedded system makers will have to adapt to changes in customer expectations, and the right tools and consulting services can help you navigate... Read More

    Selecting and Applying DC Link Bus Capacitors for Inverter Applications

    This paper discusses how to go about choosing a capacitor technology (film or electrolytic) and several of the capacitor parameters, such as nominal capacitance, rated ripple current, and temperature, for power inverter applications of a few hundred watts ... Read More

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Save & Follow 21 October 2020

This application note describes how to test new... Read More

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Andre Lucas Silva "Great article! For a long time I've been trying... (Read More)
Karosuo "I always enjoy reading your posts, and I'm... (Read More)
KishorChadha "A great post without doubt. The information... (Read More)
ajaysankarg3 "I am using MSP430 to know the status of... (Read More)
Miro "It is very interesting to see TI entering the... (Read More)
ayusman "Hi,thanks for your comment. Yes you are right in... (Read More)
GordonScott "Many years ago I did some tests with an MC68000... (Read More)
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